Professor Smith has expertise and is able to serve as an expert witness in semiconductor IC processes and fabrication, microlithography, deposition and etch processes, and TFT/LCD flat panel technology. He has experience as a Testifying Expert in several patent matters including International Trade Commission (ITC) and Federal District Court cases. He is well versed in patent research, reverse engineering, and report writing and has testified at deposition numerous times.
Testifying and Consultant Expert Cases
2017- O’Melveny & Meyers LLP
Tessera Entities v. Samsung Electronics Co., Ltd. et al
ITC patent infringement case – Testifying Expert
Wafer-level packaging of semiconductor devices
2017- O’Melveny & Meyers LLP
Elm 3DS Innovations, LLC v. Micron Technologies Inc., et al
Patent infringement (USDC Delaware) - Testifying Expert
Three dimensional semiconductor memory structures
2016-2017 Kellogg Huber, PLLC and Covington & Burling LLP
MIICS & Partners and Goldcharm v. Funai Electric Co. Ltd. and Samsung Display Co. Ltd.
Patent infringement, US District Court, Delaware – Testifying Expert
TFT/LCD flat panel display technology
2016- Finnegan, Henderson, Farabow, Garrett & Dunner LLP
Taiwan Semiconductor Manufacturing Ltd. v. Godo Kaisha IP Bridge
Inter Partes Review (IPR) – Testifying Expert
Semiconductor processing and metal interconnect structures
2013- Wilmer Cutler Pickering Hale and Dorr LLP
ASML Holding NV and Carl Zeiss SMT v. Nikon Corp.
International Centre for Dispute Resolution (ICDR) – Testifying Expert
Semiconductor lithography equipment ant processing
2013-2017 Dentons US LLP
Eidos Display, LLC v. AU Optronics Corp. et al
Patent Infringement (USDC, E. Texas) – Testifying Expert
Thin film transistor (TFT) processing for LCD flat panel devices
2014-2015 Weil, Gotshal & Manges LLP
DSS Technology Management, Inc. vs. Samsung Electronics Co. Ltd.
Inter partes review petition - Testifying Expert
Multiple patterning for integrated circuit processing
2013-2015 Ropes and Gray LLP
Spansion LLC v. Macronix America Co., Ltd. et al
ITC patent infringement case – Testifying Expert
Flash memory chip method and processes
2013 –2014 McKenna Long & Aldridge LLP
Eidos Display, LLC v. AU Optronics Corp. et al
Patent Infringement (USDC, E. Texas) – Testifying Expert
Thin film transistor (TFT) processing for LCD flat panel devices
2013-2014 Mintz, Levin, Cohn, Ferris, Glovsky, and Pepeo PC
Graphics Properties Holdings, Inc. v. Panasonic Corp. of North America et al (Toshiba, Barnes and Noble, Google, Hewlett-Packard, Lenova, and ZTE) – Testifying Expert
Patent infringement (Delaware Federal District)
Wide angle LCD display devices and backlighting
2012-2014 Bunsow, DeMory, Smith, & Allison LLP
NXP B.V. v. Research in Motion Ltd. et. al. (TriQuint, SanDisk, Hynix, and Qualcomm)
Patent Infringement (USDC, FLA Middle District), IPR (USPTO) – Testifying Expert
Dummy pattern fill for integrated circuit fabrication
2011 –2012 Mintz, Levin, Cohn, Ferris, Glovsky, and Pepeo PC
Graphics Properties Holdings v. Respondents (RIM, HTC, LG, Apple, Samsung, and Sony)
ITC Patent Infringement – Testifying Expert
LCD stack configuration for display devices
2011 O’Melveny and Meyers
Samsung Electronics Co. Ltd. v. AU Optronics Corp. et al (Acer, BenQ, and SANYO)
ITC Patent infringement
Flat panel (LCD) display device manufacturing processes
2010-2011 McDermott Will & Emery
Spansion Inc. v. Samsung Electronics Co
ITC patent infringement case – Testifying Expert
Contact hole processes for flash memory chips
2011- Keker and Van Nest LLP
STC UNM v. Intel Corp.
Patent infringement (USDC, New Mexico) – Testifying Expert
Lithography techniques and integrated circuit products
2010-2012 Irell & Manella LLP
Patent re-examination
USPTO re-examination and hearing – Testifying Expert
Flat panel LCD illumination devices
2010 Keker and Van Nest LLP
STC UNM v. Taiwan Semiconductor Manufacturing Co.
ITC patent infringement
Lithography techniques and integrated circuit products
2010-2011 McDermott Will & Emery
Spansion LLC v. Samsung Electronics Co. (and counter-claim)
Patent infringement case (USDC, E.D. Va. District) – Testifying Expert
Flash memory device processes
2010-2011 Irell & Manella LLP
Chi Mei Innolux v. Sony Corporation
ITC patent infringement case
LCD flat panel patterned electrodes
2010-2011 Ropes and Gray LLP
Samsung Electronics Co. v. Spansion Japan Ltd.
ITC patent infringement case
Lithography and etch processing for flash memory products
2010 Sidley Austin, LLP
Patent infringement. Expert witness for defendant; prior art research; drafting of expert reports and claim charts.
Barrier thin film layers for metallization and deposition of ICs
2010 Fish and Richardson P.C.
ITC case – Patent infringement. Expert witness for plaintiff.
Liquid crystal display (LCD) modules and flat panel technology
2009-10 Fish and Richardson P.C.
Patent infringement. Expert witness for defendant.
Liquid crystal display (LCD) technology
2009-10 Fish and Richardson P.C.
Patent Interference. Research prior art, prosecution history, and documents; draft report.
Organic light emitting diode (OLED) display devices
2008-09 Steptoe and Johnson, LLP
ITC case - Patent Infringement. Expert witness for defendant; prior art research; review documentation, references, and prosecution history; draft expert reports; provided deposition testimony and trial testimony (bench).
Polysilicon and amorphous silicon technology; silicon-oxi-nitride anti-reflection coating deposition technology
2008 Steptoe and Johnson, LLP
ITC case - Patent Infringement. Expert witness for defense; prior art research; review documentation, references, and prosecution history; provided technical consulting.
Wide bandgap (II-VI and III-V) semiconductor materials processing for short-wavelength LEDs and laser diodes
2006-10 Wolf Block Schorr and Solis-Cohen, LLP
Bernstein Litowitz Berger & Grossmann LLP
Patent Infringement. Main expert consultant and expert witness for plaintiff (validity and infringement), testified at hearings (including Markman), draft reports, created demonstratives for hearings, reviewed documentation and references including US and foreign prosecution history, prior art analysis, provide consulting and reports for re-examination case, presented IP position at PTO re-examination interview.
Lithography and fabrication methods for LCD flat panel manufacturing
2007-08 Ropes & Gray, LLP
Patent Infringement. Expert witness for defense (invalidity), prior art research, review documentation, references and prosecution history, provide technical consulting and guidance, draft expert reports for invalidity.
Silicon wafer cleaning and preparation
2007-08 Fish and Richardson P.C.
ITC case- Patent Infringement. Main expert witness for defense; testified at trial for invalidity and non-infringement, prior art research; provided testimony at multiple depositions; analysis of patents, documentation and references including US and foreign prosecution history; drafted expert reports for invalidity and non-infringement; created demonstratives for trial.
Thin film and diffractive elements for photomask mask light blocking
2005-06 Vinson & Elkins, LLP
Patent Infringement. Served as main expert for plaintiff (validity and infringement); provided compelling experimental evidence for plaintiff; patent analysis; reviewed documentation, references, and prosecution history; drafted expert reports for validity and infringement; provided testimony at multiple depositions, prepared demonstratives for trial testimony.
Silicon wafer preparation and coating
2004-05 Irell & Manella, LLP
Patent Infringement - Jury trial. Main expert witness for defense, testified at trial (jury) for invalidity and non-infringement, drafted expert reports for invalidity and non-infringement, prior art research, provided testimony at deposition, conducted experiments and demonstratives to support case for invalidity.
Scanning projection lithography method and apparatus
1997-03 Ward Norris Heller & Reidy, LLP
Multi-state litigation, allegations regarding various chemicals used in the manufacturing of semiconductor devices. Expert consultant, drafted reports, carried out technical training for law team.
Allegations regarding various chemicals used in an manufacturing of semiconductor devices
1997-03 Ward Norris Heller & Reidy, LLP
Kasowitz Benson Torres & Friedman, LLP
Steptoe & Johnson, LLP
Expert witness and consultant for defense, drafted reports, provided testimony at deposition.
Allegations regarding various chemicals used in an manufacturing of semiconductor devices